发明名称 Lithographic apparatus and device manufacturing method
摘要 A controlled aperture provides an opening through a barrier separating two parts of the apparatus to enable a pulse of radiation to be radiated from one part of the apparatus to the a second part. The controlled aperture closes the opening between the pulses of radiation to minimize the gas flow between the first and second parts.
申请公布号 US2004013226(A1) 申请公布日期 2004.01.22
申请号 US20030396693 申请日期 2003.03.26
申请人 ASML NETHERLANDS, B.V. 发明人 BAKKER LEVINUS PIETER;JONKERS JEROEN;VAN DIJSSELDONK ANTONIUS JOHANNES JOSEPHUS;MARIE DIERICHS MARCEL MATHIJS THEODORE
分类号 G21K1/04;G03F7/20;G21K5/00;G21K5/02;H01L21/027;H05G2/00;(IPC1-7):G21K5/00 主分类号 G21K1/04
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