发明名称 Single-wafer-processing type CVD apparatus
摘要 A single-wafer-processing type CVD apparatus for forming a thin film on an object to be processed includes a reaction chamber, a susceptor for placing the object thereon, a shower plate for emitting a jet of reaction gas to the object, which is set up in parallel and opposing to the susceptor, an orifice for bringing a liquid raw material and a carrier gas into the reaction chamber, which is formed through the ceiling of the reaction chamber, an evaporation plate means for vaporizing the liquid raw material, which is set up in a space between the ceiling of the reaction chamber and the shower plate, and a temperature controlling mechanism for controlling the shower plate and the evaporation plate means at respective given temperatures.
申请公布号 US2004011292(A1) 申请公布日期 2004.01.22
申请号 US20030618900 申请日期 2003.07.14
申请人 SHIMIZU AKIRA;FUKUDA HIDEAKI;KANAYAMA HIROKI 发明人 SHIMIZU AKIRA;FUKUDA HIDEAKI;KANAYAMA HIROKI
分类号 C23C16/54;C23C16/44;C23C16/448;C23C16/455;C23C16/52;H01L21/31;(IPC1-7):C23C16/00 主分类号 C23C16/54
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