发明名称 Semiconductor memory device
摘要 A semiconductor memory device is provided which is capable of correcting efficiently bits having a low error rate in a Pause Refresh Tail distribution and of greatly reducing a data holding current by lengthening a refresh period so that the refresh period exceeds a period for a Pause Refresh real power. The semiconductor memory device is made up of a 16-bit SDRAM (Synchronous Dynamic Random Access Memory) having a Hamming Code and including an ECC (Error Correcting Code) circuit made up of a encoding circuit being controlled by a first test signal to output by arithmetic operations a parity bit corresponding to an information bit, a decoding circuit being controlled by a second test signal to output an error location detecting signal indicating an error bit in bits of a codeword, and an error correcting circuit being controlled by a third test signal to input an error location detecting signal and to output an error bit in a reverse manner.
申请公布号 US2004008562(A1) 申请公布日期 2004.01.15
申请号 US20030617040 申请日期 2003.07.11
申请人 ELPIDA MEMORY, INC 发明人 ITO YUTAKA;NAKAI KIYOSHI
分类号 G11C29/42;G06F11/10;G11C11/401;G11C11/406;G11C29/04;(IPC1-7):G11C7/00 主分类号 G11C29/42
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