发明名称 Method and system for performing equipotential sensing across a memory array to eliminate leakage currents
摘要 A method and system for minimizing a leaked current within an array of memory cells as well as a method and system for differentiating a resistive value within a sensed memory cell during a read operation are disclosed. The memory array includes a plurality of bit lines and word lines that are cross-coupled via a plurality of memory cells. Each memory cell is limited in providing a conductive path in a first direction only by way of a unidirectional element. Such unidirectional elements typically comprise of diodes. The apparatus utilizes the diodes to form a current path from the bit line to the word line having passed through the diode and resistive memory cell. Further, a differential sense amplifier is utilized to differentiate the sensed current during a read operation from a reference value after an equipotential value is placed across the array to limit leakage current from developing within adjoining word and bit lines during a sense operation of a given memory cell.
申请公布号 US6678189(B2) 申请公布日期 2004.01.13
申请号 US20020084111 申请日期 2002.02.25
申请人 HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. 发明人 TRAN LUNG T.
分类号 G11C13/00;G11C11/15;G11C11/16;H01L21/8246;H01L27/10;H01L27/105;H01L43/08;(IPC1-7):G11C11/15 主分类号 G11C13/00
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