发明名称 |
METHOD FOR MANUFACTURING CMOS IMAGE SENSOR USING BUTTING CONTACT |
摘要 |
PURPOSE: A method for manufacturing a CMOS image sensor is provided to improve yield of the image sensor by using butting contact between a gate and a drain of a drive transistor. CONSTITUTION: A drive transistor including a source/drain and a gate electrode(31) is formed on a substrate(30). After a metal film is formed on the resultant structure, the metal film is partially exposed by using a photoresist pattern. Silicon atoms are implanted into the exposed metal film. By annealing the resultant structure, a metal silicide layer(35") is formed for butting contact between the gate electrode and the drain. Then, a metal interconnection(40) is formed on the metal silicide layer.
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申请公布号 |
KR20040003955(A) |
申请公布日期 |
2004.01.13 |
申请号 |
KR20020038985 |
申请日期 |
2002.07.05 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, EUN JI;PARK, JAE YEONG |
分类号 |
H01L27/146;(IPC1-7):H01L27/146 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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