发明名称 METHOD FOR MANUFACTURING CMOS IMAGE SENSOR USING BUTTING CONTACT
摘要 PURPOSE: A method for manufacturing a CMOS image sensor is provided to improve yield of the image sensor by using butting contact between a gate and a drain of a drive transistor. CONSTITUTION: A drive transistor including a source/drain and a gate electrode(31) is formed on a substrate(30). After a metal film is formed on the resultant structure, the metal film is partially exposed by using a photoresist pattern. Silicon atoms are implanted into the exposed metal film. By annealing the resultant structure, a metal silicide layer(35") is formed for butting contact between the gate electrode and the drain. Then, a metal interconnection(40) is formed on the metal silicide layer.
申请公布号 KR20040003955(A) 申请公布日期 2004.01.13
申请号 KR20020038985 申请日期 2002.07.05
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, EUN JI;PARK, JAE YEONG
分类号 H01L27/146;(IPC1-7):H01L27/146 主分类号 H01L27/146
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