发明名称 POLYMER COMPOUND, RESIST MATERIAL AND PATTERN-FORMING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a polymer compound and a resist material responding to a high energy beam and having an alkali-dissolving contrast and excellent plasma etching resistance without impairing transparency in &le;200 nm wavelength. <P>SOLUTION: The polymer compound comprises a recurring unit having a functional group represented by formula (1) (wherein R<SP>1</SP>is CH<SB>2</SB>, O, S or SO<SB>2</SB>; R<SP>2</SP>to R<SP>5</SP>are each H, F, an alkyl group or a fluorinated alkyl group, R<SP>6</SP>-SO<SB>3</SB>R<SP>7</SP>or R<SP>6</SP>-SO<SB>2</SB>R<SP>7</SP>and at least one among R<SP>2</SP>to R<SP>5</SP>contains R<SP>6</SP>-SO<SB>3</SB>R<SP>7</SP>or R<SP>6</SP>-SO<SB>2</SB>R<SP>7</SP>; R<SP>6</SP>is a single bond or an alkylene group or a fluorinated alkylene group; R<SP>7</SP>is F or a fluorinated alkyl group which may contain a hydrophilic group such as hydroxy group; and a is 0 or 1), and has 1,000 to 500,000 weight average molecular weight. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004002724(A) 申请公布日期 2004.01.08
申请号 JP20030075374 申请日期 2003.03.19
申请人 SHIN ETSU CHEM CO LTD;MATSUSHITA ELECTRIC IND CO LTD;CENTRAL GLASS CO LTD 发明人 HARADA YUJI;HATAKEYAMA JUN;KAWAI YOSHIO;SASAKO MASARU;ENDO MASATAKA;KISHIMURA SHINJI;MAEDA KAZUHIKO;OTANI MITSUTAKA;KOMORIYA HARUHIKO
分类号 G03F7/039;C08F212/14;C08F220/38;C08F232/04;H01L21/027 主分类号 G03F7/039
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