发明名称 |
Termination structure for mosgated power devices |
摘要 |
The termination of a MOSgated device is formed by a trench bevel which surrounds the active device area. The trench bevel has flat walls which extend into and through the epitaxial layer containing the active area which has a lateral extend equal to or less than the thickness of the epitaxial layer. The surface of the bevel is coated with a resistive film, preferably, an amorphous silicon which connects the device source to the device drain to cause the electric field in the epitaxial silicon to the linearly distributed over the length of the bevel.
|
申请公布号 |
US2004004238(A1) |
申请公布日期 |
2004.01.08 |
申请号 |
US20030613586 |
申请日期 |
2003.07.02 |
申请人 |
INTERNATIONAL RECTIFIER CORPORATION |
发明人 |
QU ZHIJUN |
分类号 |
H01L29/06;H01L29/40;H01L29/78;(IPC1-7):H01L27/108;H01L29/76;H01L29/94;H01L31/119 |
主分类号 |
H01L29/06 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|