发明名称 |
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for fabricating a semiconductor device is provided to prevent a bridging phenomenon between cells by additionally performing a process in a piranha solution bath in a wet etch process of a cell region oxide layer. CONSTITUTION: The cell region oxide layer of the semiconductor device is etched in a buffered hydrogen fluoride(BHF) solution bath(100), including a cell region including a lower electrode and a peripheral region including a photoresist layer. The resultant structure is cleaned in a deionized(DI) water rinse bath(102). The photoresist layer is removed and the surface of the lower electrode is hydrophilic-oxidized. The resultant structure is cleaned in the DI water rinse bath. The resultant structure is dried in a dry unit(104).
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申请公布号 |
KR20040002299(A) |
申请公布日期 |
2004.01.07 |
申请号 |
KR20020037752 |
申请日期 |
2002.06.29 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHOI, GEUN MIN;KIM, GYU HYEON;YOON, HYO GEUN |
分类号 |
H01L21/308;H01L21/304;H01L21/306;H01L21/311;H01L21/316;H01L21/8242;H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L21/308 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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