发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT INCORPORATED WITH SELF-TEST FUNCTION AND SYSTEM COMPRISING IT
摘要 PURPOSE: To provide a semiconductor integrated circuit incorporated with a self-test function, capable of performing a self-test on a peripheral function block and reducing test costs. CONSTITUTION: This system comprises an input/output port connected with a pad 1 and constituted of a port direction register 3, a port register 4 and a comparator 5, and the peripheral function block 6 connected with the pad 1. When output of the peripheral function block 6 is desired to be tested, an expected value for the output of the peripheral function block 6 is set to the port register 4, and a value for making the input/output port an input port is set to the port direction register 3, then the value output from the peripheral function block 6 and passed through the pad 1 and the expected value set to the port register 4 are compared by the comparator 5 for determining the test.
申请公布号 KR20040002440(A) 申请公布日期 2004.01.07
申请号 KR20030011562 申请日期 2003.02.25
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 KIMURA KENJI
分类号 G01R31/28;G01R31/317;G01R31/3185;G01R31/3187;G06F11/22;(IPC1-7):G11C29/00 主分类号 G01R31/28
代理机构 代理人
主权项
地址