发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to minimize the loss of a gate electrode and a hard mask and to improve process margins when forming SAC(Self Align Contact). CONSTITUTION: An insulating layer(35) is formed on a substrate(30) having a plurality of conductive patterns(32). A hard mask(36) is formed by depositing a desired substance on the insulating layer and selectively etching the desired substance. An opening part is formed to define a contact region by selectively etching the insulating layer(35) using the hard mask(36) as a mask. An etch stop layer(39) is formed on the entire surface of the resultant structure. A contact hole(40) is then formed by selectively etching the etch stop layer and the insulating layer using different etching selectivity.
申请公布号 KR20040001919(A) 申请公布日期 2004.01.07
申请号 KR20020037253 申请日期 2002.06.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, HO SEOK;LEE, SEONG GWON
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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