发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is provided to minimize the loss of a gate electrode and a hard mask and to improve process margins when forming SAC(Self Align Contact). CONSTITUTION: An insulating layer(35) is formed on a substrate(30) having a plurality of conductive patterns(32). A hard mask(36) is formed by depositing a desired substance on the insulating layer and selectively etching the desired substance. An opening part is formed to define a contact region by selectively etching the insulating layer(35) using the hard mask(36) as a mask. An etch stop layer(39) is formed on the entire surface of the resultant structure. A contact hole(40) is then formed by selectively etching the etch stop layer and the insulating layer using different etching selectivity.
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申请公布号 |
KR20040001919(A) |
申请公布日期 |
2004.01.07 |
申请号 |
KR20020037253 |
申请日期 |
2002.06.29 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, HO SEOK;LEE, SEONG GWON |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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