发明名称 Method for recognizing and replacing defective memory cells in a memory
摘要 A method for recognizing a defective memory cell in a memory having a plurality of memory cells includes directly comparing predetermined properties of the memory cells to one another. Predetermined identical information is read into each memory cell of the plurality of memory cells, and then the information stored in the plurality of memory cells is read out. For each one of the plurality of memory cells a strength of a read-out signal is determined, and the memory cells are sorted depending on the strength of the respective read-out signal.
申请公布号 US6674674(B2) 申请公布日期 2004.01.06
申请号 US20020164213 申请日期 2002.06.06
申请人 INFINEON TECHNOLOGIES AG 发明人 POECHMUELLER PETER
分类号 G11C29/00;G11C29/38;G11C29/44;G11C29/50;G11C29/52;(IPC1-7):G11C29/00 主分类号 G11C29/00
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