发明名称 LITHOGRAPHIC TYPE MICROELECTRONIC SPRING STRUCTURES WITH IMPROVED CONTOURS
摘要 Improved lithographic type microelectronic spring structures and methods are disclosed, for providing improved tip height over a substrate, an improved elastic range, increased strength and reliability, and increased spring rates. The improved structures are suitable for being formed from a single integrated layer (or series of layers) deposited over a molded sacrificial substrate, thus avoiding multiple stepped lithographic layers and reducing manufacturing costs. The present invention additionally provides a lithographic type spring contact that is corrugated to increase it effective length and elastic range and to reduce its footprint over a substrate, and springs which are contoured in plan view. The present invention further provides combination (both series and parallel) electrical contacts tips for lithographic type microelectronic spring structures. The microelectronic spring structures according to the present invention are particularly useful for making very fine pitch arrays of electrical connectors for use with iUS0150688 circuits and other substrate-mounted electronic devices.
申请公布号 WO02063682(A3) 申请公布日期 2003.12.31
申请号 WO2001US49922 申请日期 2001.11.08
申请人 FORMFACTOR, INC.;ELDRIDGE, BENJAMIN, N.;WENZEL, STUART, W. 发明人 ELDRIDGE, BENJAMIN, N.;WENZEL, STUART, W.
分类号 G01R1/04;G01R1/067;G01R1/073;H01L23/48;H01R13/24;H05K3/40;H05K7/10 主分类号 G01R1/04
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