发明名称 |
Apparatus and method for fabricating semiconductor device |
摘要 |
The present invention provides various measures for preventing particles from being deposited on objects being processed during plasma processing. An electrode is disposed inside a reaction chamber, which is kept in a vacuum state by a turbo molecule pump and a dry pump that are provided for a main exhaust pipe. A substrate is placed on the electrode, a gas is introduced into the reaction chamber and then a voltage is applied from an RF power supply to the electrode and the substrate, thereby generating plasma regions in the reaction chamber. A large number of exhaust pipes, each having an opening, are disposed on substantially the same plane as the plane on which the interface between a plasma glow region and a plasma sheath is located. These multiple openings surround the interface between the plasma glow region and the plasma sheath.
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申请公布号 |
US6669812(B2) |
申请公布日期 |
2003.12.30 |
申请号 |
US19980145127 |
申请日期 |
1998.09.01 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
JIWARI NOBUHIRO;IMAI SHINICHI |
分类号 |
H01L21/205;C23C16/00;H01J37/32;H01L21/3065;H05H1/00;(IPC1-7):H05H1/00 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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