发明名称 Polishing apparatus and method, and wafer evacuation program
摘要 In a wafer polishing apparatus which polishes a wafer surface or in a wafer cleaner, there are provided a transfer and cleaning chamber which shuts off a wafer from the outside air and an inert gas supply device which fills an inert gas into the transfer and cleaning chamber. Thus, there are provided a polishing apparatus, a cleaner, a cleaning method and a wafer evacuation program which can prevent the oxidation and modification of a wafer surface in each step, such as the polishing step of a wafer, the transfer step after polishing, the cleaning step after polishing, the drying step after polishing, the inspection step after polishing, and the storage step after polishing.
申请公布号 US2003236057(A1) 申请公布日期 2003.12.25
申请号 US20030464458 申请日期 2003.06.19
申请人 TOKYO SEIMITSU CO. LTD. 发明人 FUJITA TAKASHI
分类号 B24B37/04;H01L21/304;(IPC1-7):B24B1/00;B24B7/19;B24B55/04 主分类号 B24B37/04
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