发明名称 Semiconductor device and method of manufacturing the same
摘要 In a conventional method of crystallization using a laser beam, variance (or dispersion) in a TFT characteristic becomes large, which causes various functions of a semiconductor device comprising TFTs as components of its electronic circuit to be restrained. A first shape of semiconductor region having on its one side a plurality of sharp convex top-end portions is formed first and a continuous wave laser beam is used for radiation from the above region so as to crystallize the first shape of semiconductor region. A continuous wave laser beam condensed in one or plural lines is used for the laser beam. The first shape of semiconductor region is etched to form a second shape of semiconductor region in which a channel forming region and a source and drain region are formed. The second shape of semiconductor region is disposed so that a channel forming range would be formed on respective crystal regions extending from the plurality of convex end portions. A semiconductor region adjacent to the channel forming region is eliminated.
申请公布号 US2003234395(A1) 申请公布日期 2003.12.25
申请号 US20020321841 申请日期 2002.12.18
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD 发明人 KOKUBO CHIHO;SHIGA AIKO;YAMAZAKI SHUNPEI;MIYAIRI HIDEKAZU;DAIRIKI KOJI;TANAKA KOICHIRO
分类号 G02F1/1368;H01L21/20;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/04;H01L29/786;(IPC1-7):H01L29/76 主分类号 G02F1/1368
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