Semiconductor device having temperature detecting function, testing method, and refresh control method of semiconductor storage device having temperature detecting function

摘要

A semiconductor device, a testing method and a refresh control method having a temperature detecting function to detect a predetermined temperature with little dispersion and to optimize the acting state in accordance with the predetermined temperature detected. The semiconductor device includes at least a memory cell, a refresh control circuit for switching the refresh period tREF of the memory cell, and a temperature detecting unit to be biased with a bias voltage VB+ coming from a voltage bias unit including a reference unit and a regulator unit.