发明名称 |
Optical system with correcting structure for producing product structure for substrate, with critical dimension and lithographic appliance |
摘要 |
A correcting structure (C) is produced for making a product structure (D) of the substrate (2). The correction structure is dependent functionally on at least one image distortion of a lithography appliance and or is dependent on at least one product error in a subsequent production step of the substrate. The image distortion and or the production error is dependent on at least one critical dimension (CD) of a structure on the substrate. |
申请公布号 |
DE10223249(A1) |
申请公布日期 |
2003.12.18 |
申请号 |
DE2002123249 |
申请日期 |
2002.05.22 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
SCHAETZ, THOMAS;RAU, JENSPETER;KAMM, FRANK-MICHAEL;EHRMANN, ALBRECHT |
分类号 |
G03F1/00;G03F1/36;G03F7/20 |
主分类号 |
G03F1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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