发明名称 Optical system with correcting structure for producing product structure for substrate, with critical dimension and lithographic appliance
摘要 A correcting structure (C) is produced for making a product structure (D) of the substrate (2). The correction structure is dependent functionally on at least one image distortion of a lithography appliance and or is dependent on at least one product error in a subsequent production step of the substrate. The image distortion and or the production error is dependent on at least one critical dimension (CD) of a structure on the substrate.
申请公布号 DE10223249(A1) 申请公布日期 2003.12.18
申请号 DE2002123249 申请日期 2002.05.22
申请人 INFINEON TECHNOLOGIES AG 发明人 SCHAETZ, THOMAS;RAU, JENSPETER;KAMM, FRANK-MICHAEL;EHRMANN, ALBRECHT
分类号 G03F1/00;G03F1/36;G03F7/20 主分类号 G03F1/00
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