发明名称 |
METHOD FOR FABRICATING METAL FILM FOR SEMICONDUCTOR INTERCONNECTION |
摘要 |
PURPOSE: A method for fabricating metal film for semiconductor interconnection is provided to prevent oxidation of copper thin film in formation of copper semiconductor interconnection using electrolytic plating. CONSTITUTION: The method comprises a step of preparing a semiconductor substrate formed in a fine pattern; a step of forming a copper thin film(140) all over the surface the semiconductor substrate by putting the semiconductor substrate into a copper electrolytic plating solution and impressing reduction potential to the semiconductor substrate so that copper electrolytic plating is performed on the semiconductor substrate; a substrate flattening step of flatly etching the whole surface of the semiconductor substrate so that only the copper thin film(140) formed on a groove part of the semiconductor substrate is remained; and a thin film forming step of substituting silver for the surface of the remained copper thin film by dipping the flattened semiconductor substrate into a silver substitution solution, wherein the method further comprises a heat treatment step of heat treating the silver thin film(150) formed semiconductor substrate at a nitrogen atmosphere.
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申请公布号 |
KR20030095005(A) |
申请公布日期 |
2003.12.18 |
申请号 |
KR20020032506 |
申请日期 |
2002.06.11 |
申请人 |
KIM, JAE JEONG |
发明人 |
KIM, JAE JEONG;KIM, SU GIL;KIM, YONG SIK |
分类号 |
C23C18/16;(IPC1-7):C23C18/16 |
主分类号 |
C23C18/16 |
代理机构 |
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主权项 |
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地址 |
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