A METHOD FOR TESTING AN ELECTRONIC CIRCUIT BY LOGICALLY COMBINING CLOCK SIGNALS, AND AN ELECTRONIC CIRCUIT PROVIDED WITH FACILITIES FOR SUCH TESTING

摘要

An electronic circuit has a plurality of nodes at which a plurality of clock signals are present in operational use. The clock signals should have a pre-determined timing relationship amongst themselves. The circuit includes logic circuitry having inputs connected to the nodes and having an output to provide a pulse train. Any discrepancy between the actual and ideal pulse trains indicates a fault.