Method of Introducing Conductivity Type Determining Impurities into a Semiconductor Substrate,申请号GB19670029522-传众专利搜索

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发明名称	Method of Introducing Conductivity Type Determining Impurities into a Semiconductor Substrate
摘要
申请公布号	GB1195863(A)	申请公布日期	1970.06.24
申请号	GB19670029522	申请日期	1967.06.27
申请人	TEXAS INSTRUMENTS INCORPORATED	发明人	FREDERICK JOHN STRIETER
分类号	H01L21/00;H01L21/82	主分类号	H01L21/00
代理机构		代理人
主权项
地址

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