发明名称 |
POLISHING PAD AND CHEMICAL MECHANICAL POLISHING APPARATUS HAVING THE SAME |
摘要 |
PURPOSE: A polishing pad and a CMP(Chemical Mechanical Polishing) apparatus having the same are provided to be capable of preventing the generation of surface scratch at a window for reducing the noise contained in the light reflected from a substrate. CONSTITUTION: A polishing pad(202) is provided with a window(204), the second groove(204a) formed at the center portion of the window, a plurality of circular type first grooves(202a) spaced apart from each other, and the third groove(204b) formed at the peripheral portion of the window for connecting the first grooves with the second groove. At this time, light is supplied to the surface of a substrate through the second groove. Preferably, the first, second, and third groove have the same depth with each other.
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申请公布号 |
KR20030094491(A) |
申请公布日期 |
2003.12.12 |
申请号 |
KR20020031448 |
申请日期 |
2002.06.04 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HWANG, IN SEOK;KO, YONG SEON;MIN, CHUNG GI |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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