发明名称 |
ISOLATION LAYER OF SEMICONDUCTOR DEVICE AND FORMING METHOD THEREOF |
摘要 |
PURPOSE: An isolation layer of a semiconductor device and a method for forming the same are provided to prevent generation of voids by filling a silicon oxide layer into a trench having high aspect ratio using thermal oxidation processing. CONSTITUTION: A trench mask pattern is formed on a semiconductor substrate(100) by sequentially stacking a pad oxide pattern(110) and a hard mask pattern(120). A trench is formed by selectively etching the exposed substrate using the trench mask pattern. A trench thermal oxide layer(140,150) is filled into the trench by thermal oxidation of the inner walls of the trench. The trench mask pattern is then removed.
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申请公布号 |
KR20030093793(A) |
申请公布日期 |
2003.12.11 |
申请号 |
KR20020031644 |
申请日期 |
2002.06.05 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, JONG WAN |
分类号 |
H01L21/76;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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