发明名称 ISOLATION LAYER OF SEMICONDUCTOR DEVICE AND FORMING METHOD THEREOF
摘要 PURPOSE: An isolation layer of a semiconductor device and a method for forming the same are provided to prevent generation of voids by filling a silicon oxide layer into a trench having high aspect ratio using thermal oxidation processing. CONSTITUTION: A trench mask pattern is formed on a semiconductor substrate(100) by sequentially stacking a pad oxide pattern(110) and a hard mask pattern(120). A trench is formed by selectively etching the exposed substrate using the trench mask pattern. A trench thermal oxide layer(140,150) is filled into the trench by thermal oxidation of the inner walls of the trench. The trench mask pattern is then removed.
申请公布号 KR20030093793(A) 申请公布日期 2003.12.11
申请号 KR20020031644 申请日期 2002.06.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JONG WAN
分类号 H01L21/76;(IPC1-7):H01L21/76 主分类号 H01L21/76
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