发明名称 TOPOLOGY MODELER
摘要 According to one embodiment of the invention, a method for modeling a feature associated with a deformed material is provided. The method includes generating a first mesh having a model of a feature and a second mesh. A normal distance between a point on the model of the feature and the surface of the first mesh is measured. A location of the surface point of the first mesh that is used to measure the normal distance is determined. The determined location is used to locate the same surface point on the second mesh. A new location for a new point corresponding to the point on the model of the feature associated with the first mesh is determined. The new location is located at the distance as the determined normal distance, but along a normal vector that intersects the same surface point on the second mesh.
申请公布号 WO03102826(A2) 申请公布日期 2003.12.11
申请号 WO2003US17191 申请日期 2003.05.30
申请人 ELECTRONIC DATA SYSTEMS CORPORATION 发明人 BROMBOLICH, DANIEL L.
分类号 G06F17/50;G06T17/20 主分类号 G06F17/50
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