发明名称 MEMORY CHECK CIRCUIT
摘要 PROBLEM TO BE SOLVED: To make a memory check in a short period of time with a simple configuration without any limitation even during the operation of a device. SOLUTION: An address specifying circuit 1 has an address counter 11 inside and outputs a count address 7. A storage circuit 2 inputs write data 4 and a write address 5 from a memory (not illustrated) and the count address 7 outputted by the address counter 11, stores the write data 4 of the write address 5 that the count address 7 specifies, and outputs the stored data 13. A comparing circuit 3 inputs a read address 8 and read data 9 from the memory and the count address 7 outputted by the address counter 11, compares the read data 8 of the read address 8 specified by the count address 7 with the stored data 13, and outputs fault information 12 when they do not match each other. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003345670(A) 申请公布日期 2003.12.05
申请号 JP20020148351 申请日期 2002.05.22
申请人 NEC CORP 发明人 MATSUDO KAZUTOSHI
分类号 G06F12/16;(IPC1-7):G06F12/16 主分类号 G06F12/16
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