发明名称 CHARACTERISTICS MEASURING CIRCUIT AND SEMICONDUCTOR DEVICE EMPLOYING IT
摘要 PROBLEM TO BE SOLVED: To provide a characteristics measuring circuit capable of measuring the characteristics of the output potential of an electronic volume circuit having an offset with high accuracy. SOLUTION: The characteristics measuring circuit is provided with a sample hold circuit 11 receiving the output potential of the electronic volume circuit 20 at a specified timing and holding it for a specified time, a differential circuit 12 sequentially outputting a potential corresponding to the difference of output potential between the electronic volume circuit 20 and the sample hold circuit 11, an A/D converter 13 for receiving the output potential of the differential circuit 12 sequentially and converting it into a digital signal sequentially, and a judgement circuit 54 receiving 255 digital signals sequentially from the A/D converter 13 and judging whether variation in the output potential of the electronic volume circuit 20 falls within a specified range or not, over the entire variable range of the input data. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003344510(A) 申请公布日期 2003.12.03
申请号 JP20020156803 申请日期 2002.05.30
申请人 SEIKO EPSON CORP 发明人 SANO MASATOSHI
分类号 G01R31/316;H03F3/34;(IPC1-7):G01R31/316 主分类号 G01R31/316
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