发明名称 OPTICALLY SAMPLING MEASURING SYSTEM AND ITS METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an optically sampling measuring system and its method which can accurately measure a Q-value of light to be measured in the optically sampling measuring system utilizing the nonlinear optical effect. <P>SOLUTION: The optically sampling measuring system having a nonlinear optical element 11 into which light to be measured SG1 and sampling light SG2 are input. A photodetector 12 receives light emitted from the nonlinear optical element 11, and is provided with a memory section 15 which previously stores a value of a noise occurring in the photodetector 12, and a calculating section 17 which subtracts the value of the noise stored in the memory section 15 from a value of a noise being detected when measuring the light to be measured SG1, thereby calculating the Q-value of the light to be measured SG1 from the subtracted value of noise. <P>COPYRIGHT: (C)2004,JPO</p>
申请公布号 JP2003344168(A) 申请公布日期 2003.12.03
申请号 JP20020155557 申请日期 2002.05.29
申请人 ANDO ELECTRIC CO LTD 发明人 YANAGISAWA KOJU;KANZAKI MASATOSHI
分类号 G01J11/00;G02F1/37;(IPC1-7):G01J11/00 主分类号 G01J11/00
代理机构 代理人
主权项
地址