发明名称 Selective nitride: oxide anisotropic etch process
摘要 An anisotropic etching process for a nitride layer of a substrate, the process comprising using an etchant gas which comprises a hydrogen-rich fluorohydrocarbon, an oxidant and a carbon source. The hydrogen-rich fluorohydrocarbon is preferably one of CH3F or CH2F2, the carbon source is preferably one of CO2 or CO, and the oxidant is preferably O2. The fluorohydrocarbon is preferably present in the gas at approximately 7%-35% by volume, the oxidant is preferably present in the gas at approximately 1%-35% by volume, and the carbon source is preferably present in the gas at approximately 30%-92%.
申请公布号 US6656375(B1) 申请公布日期 2003.12.02
申请号 US19980014806 申请日期 1998.01.28
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ARMACOST MICHAEL D.;DOBUZINSKY DAVID M.;MALINOWSKI JOHN C.;NG HUNG Y.;WISE RICHARD S.;YU CHIENFAN
分类号 H01L21/302;H01L21/3065;H01L21/311;(IPC1-7):C23F1/00 主分类号 H01L21/302
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