发明名称 METHOD FOR FORMING CONTACT PLUG WITH REDUCED CONTACT RESISTANCE
摘要 PROBLEM TO BE SOLVED: To provide a method for forming a contact plug having reduced contact resistance in which processes are simplified and the formation of a native oxide layer is controlled to decrease the contact resistance. SOLUTION: This method for forming a contact plug comprises following steps; a step for forming a contact hole for exposing the surface of a silicon substrate 20 in an interlayer dielectric film 26 formed on the silicon substrate 20, a step for removing a native oxide formed in the contact hole, a step for forming a single crystal silicon layer 28 on the surface of the silicon substrate in the contact hole by epitaxial growth performed in a first reaction chamber in which pressure is 10<SP>-6</SP>Torr or lower, and filling the contact hole with polysilicon 30, in a second reaction chamber. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003338542(A) 申请公布日期 2003.11.28
申请号 JP20020380830 申请日期 2002.12.27
申请人 HYNIX SEMICONDUCTOR INC 发明人 KIM HAI-WON;CHAE SU-JIN
分类号 H01L21/28;H01L21/60;H01L21/768;H01L21/8242;(IPC1-7):H01L21/768 主分类号 H01L21/28
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