发明名称 METHOD AND SYSTEM FOR ANALYZING QUALITY OF DISPLAY DEVICE
摘要 PURPOSE: A method and a system for analyzing the quality of a display device are provided to realize the quantized quality of a display device in an objective numerical value. CONSTITUTION: A reference image pattern is output to a display device, and a display area where the reference image pattern is output is segmented, and first data for measuring the quality of each segmented picture display area is calculated(301). An image pattern for measuring an afterimage is output to the display device for a long time over the set time(302). The reference image pattern is output to the display device, and second data for measuring the quality of each segmented picture display area is calculated(303). An image pattern is normalized by using the first and second data for measuring the quality, and afterimage output of the image pattern for measuring an afterimage is quantitatively detected from the displayed image(304).
申请公布号 KR20030089785(A) 申请公布日期 2003.11.28
申请号 KR20020027646 申请日期 2002.05.18
申请人 LG.PHILIPS LCD CO., LTD. 发明人 KIM, IL HO;LEE, DON GYU
分类号 G01J3/50;G01J1/42;G01M11/00;G02F1/13;G09G3/00;G09G3/20;G09G3/36;H04N17/04;(IPC1-7):H04N17/00 主分类号 G01J3/50
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