| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To miniaturize the hardware constitution, to reduce the manufacturing cost, and to improve the throughput/cost ratio in a test system for a nonvolatile memory such as a flash memory card or the like. <P>SOLUTION: This system is provided with a DC test dock 11 storing a nonvolatile memory for a DC test and an FC test dock 21 storing a nonvolatile memory for function test separately, and the system is constituted so that each of them can perform the DC test and the function test independently, while the number of the FC test dock 21 is made more than the number of the DC test dock 11, and a plurality of nonvolatile memories test-processed time sequentially by the DC test dock 11 are test-processed in parallel by the plurality of FC test dock 21. <P>COPYRIGHT: (C)2004,JPO</p> |
