发明名称 AUTOMATIC TEST PROGRAM GENERATION SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To facilitate the alterations of the beginning addresses of an initializing part, an interrupt table and an address space table in a test program region, the beginning addresses of an access region, an instruction generating region and correct answer information and the scope of an area, and to make it possible to deal with the execution time. <P>SOLUTION: An access range and a branch range in a test program are specified by an operating means 6, an instruction in the specified access range/ branch range is generated, an insert position for the check point instruction is specified, and the check point instruction is inserted in a position designated by a check point instruction insert position control means 3a. An access/branch range can be switched to set a random value or a fixed value by a switching means 6c. Further, the position and/or range of the initializing part, the interrupt table, the address space table, and an address data region beginning position in the test program can be specified. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2003330752(A) 申请公布日期 2003.11.21
申请号 JP20030176621 申请日期 2003.06.20
申请人 FUJITSU LTD 发明人 OURA HIRONOBU;GOTO HIROSHI;HAYASHI RYOTARO;TERANISHI SHINSUKE
分类号 G06F11/28 主分类号 G06F11/28
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