发明名称 Bump formed on semiconductor device chip and method for manufacturing the bump
摘要 A bump of a semiconductor chip comprises a plurality of bond pads formed on a semiconductor chip, a conductive bump formed on the bond pads; and a sidewall insulating layer formed on sidewalls of the conductive bump. It is possible for the semiconductor chip to prevent electrical shorts and improve productivity even though a pitch of bond pad is decreased.
申请公布号 US2003214035(A1) 申请公布日期 2003.11.20
申请号 US20030426155 申请日期 2003.04.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KWON YONG-HWAN;KANG SA-YOON
分类号 H01L21/60;H01L23/485;(IPC1-7):H01L23/48;H01L23/52;H01L29/40 主分类号 H01L21/60
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