发明名称 MEASUREMENT CHIP
摘要 PROBLEM TO BE SOLVED: To enable measurement for an environment factor around a test piece in a measurement chip used for a measurement device by using an evanescent wave. SOLUTION: The measurement device is composed of a measurement chip 9, a holder 80 for holding the a measurement chip 9, and a laser light source 14 generating an optical beam 13, an incident optical system 15 for entering the light beam 13 into the measurement chip 9, a photodetector 17 for detecting light strength by receiving the light beam 13 reflected with the interface 10b of the measurement chip 9. In the measurement chip 9, a cover 72 is mounted on the upper surface of the measurement chip 9 and ion concentration in a sample liquid 11 is measured with an ion sensor 71 attached to this cover 72. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003329579(A) 申请公布日期 2003.11.19
申请号 JP20020136514 申请日期 2002.05.13
申请人 FUJI PHOTO FILM CO LTD 发明人 OTSUKA TAKASHI
分类号 G01N33/543;G01N21/03;G01N21/27;(IPC1-7):G01N21/27 主分类号 G01N33/543
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