发明名称 |
Semiconductor relay system and method for controlling the semiconductor relay system |
摘要 |
Because a semiconductor relay system of this invention comprises an across-element voltage detecting circuit 116 which delivers an across-element voltage detection signal depending on the presence/absence of an across-element voltage exceeding a predetermined threshold; an element driving circuit 112 for delivering an element driving signal in response to a control input signal; a logic-based judgement circuit 119 for delivering a logic-based judgement signal depending on the presence/absence of an across-element voltage detection signal; and a filtration circuit for removing a logic-based judgement signal of external disturbing elements to produce an element safety check signal, it is possible to reliably detect the disorder of a triac 114.
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申请公布号 |
US6650522(B2) |
申请公布日期 |
2003.11.18 |
申请号 |
US20010987691 |
申请日期 |
2001.11.15 |
申请人 |
OMRON CORPORATION |
发明人 |
HORIBATA KENJI;NAKAYAMA TERUYUKI;NAKAMURA TOSHIYUKI;YAMADA TAKAAKI;HASHIMOTO YUJI;HARADA KAZUHIRO |
分类号 |
H03K17/082;H03K17/18;(IPC1-7):H02H3/08 |
主分类号 |
H03K17/082 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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