发明名称 Nitride read-only memory cell for improving second-bit effect and method for making thereof
摘要 A NROM cell for reducing for reducing the second-bit effect is described. The NORM cell of the present invention is formed with a substrate, a silicon oxide/silicon nitride/silicon oxide (ONO) layer disposed on the substrate, a gate disposed on the silicon oxide/silicon nitride/silicon oxide layer, source/drain regions configured in the substrate beside the gate, and a shallow pocket doped region configured between the source/drain regions and the ONO layer beside the gate. The depth of the shallow pocket doped region is sufficiently small to prevent interference to the current flow that travels to the source/drain regions.
申请公布号 US6649971(B1) 申请公布日期 2003.11.18
申请号 US20020064905 申请日期 2002.08.28
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 YEH YEN-HUNG;TSAI WEN-JER;LIU MU-YI;CHAN KWANG-YANG;FAN TSO-HUNG;LU TAO-CHENG
分类号 H01L29/792;(IPC1-7):H01L29/788 主分类号 H01L29/792
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