发明名称 FLAT SURFACE PROBE AND METHOD OF MANUFACTURING FLAT PROBE
摘要 <P>PROBLEM TO BE SOLVED: To prevent a projection from being broken by coming into contact with a foreign matter attached on an optical recording medium rotating at a high speed at the time of reproducing the optical recording medium using a flat surface probe, even when the sharpened projection comes very close to the optical recording medium. <P>SOLUTION: The projection 3 projecting on one surface and made of a same material as that of a base plate 2 is protected against the shock coming from surroundings by providing a protecting member 4 around the projection 3. Thereby the projection with the sharpened tip 3 is prevented from coming into contact with the foreign matter attached on the optical recording medium D rotating at the high speed even when the projection 3 with a sharpened tip is made to come very close to the optical recording medium at the time of reproducing the optical recording medium. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2003322603(A) 申请公布日期 2003.11.14
申请号 JP20020130759 申请日期 2002.05.02
申请人 RICOH CO LTD 发明人 YAMAGUCHI TAKAYUKI
分类号 G01Q60/22;G01Q80/00;G11B7/135;G11B7/22 主分类号 G01Q60/22
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