发明名称 Double-side polishing process with reduced scratch rate and device for carrying out the process
摘要 A process for producing semiconductor wafers by double-sided polishing between two rotating, upper and lower polishing plates, which are covered with polishing cloth, while an alkaline polishing abrasive with colloidal solid fractions is being supplied, the semiconductor wafers being guided by carriers which have circumferential gear teeth and are set in rotation by complementary outer gear teeth and inner gear teeth of the polishing machine, which is distinguished by the following process steps:(a) at least one of the two sets of gear teeth of the polishing machine is at least from time to time sprayed with a liquid which substantially comprises water,(b) the alkaline polishing abrasive is fed continuously to the semiconductor wafers in a closed supply device. There is also a device which is suitable for carrying out the process.
申请公布号 US6645862(B2) 申请公布日期 2003.11.11
申请号 US20010989550 申请日期 2001.11.20
申请人 WACKER SILTRONIC GESELLSCHAFT FUR HALBLEITERMATERIALIEN AG 发明人 WENSKI GUIDO;GLAS JOHANN;ALTMANN THOMAS;HEIER GERHARD
分类号 B24B55/06;B24B37/00;B24B37/005;B24B37/04;B24B37/08;H01L21/304;H01L21/306;(IPC1-7):H01L21/302 主分类号 B24B55/06
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