| 摘要 |
A writer coil in a data head of a data storage system is tested by coupling detection circuitry to the writer coil and driving the writer coil with a periodic pulse signal generated by the detection circuitry. As a result, voltage is generated, with the detection circuitry, as a function of an inductance of the writer coil. An inductance of the writer coil is calculated as a function of the generated voltage. Electrical short circuits and discontinuities in the writer coil are identified as a function of the calculated inductance.
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