发明名称 |
Erase For 3D Non-Volatile Memory With Sequential Selection Of Word Lines |
摘要 |
An erase operation for a 3D stacked memory device adjusts a start time of an erase period and/or a duration of the erase period for each storage element based on a position of the storage element. A voltage is applied to one or both drive ends of a NAND string to pre-charge a channel to a level which is sufficient to create gate-induced drain leakage at the select gate transistors. With timing based on a storage element's distance from the driven end, the control gate voltage is lowered to encourage tunneling of holes into a charge trapping layer in the erase period. The lowered control gate voltage results in a channel-to-control gate voltage which is sufficiently high to encourage tunneling. The duration of the erase period is also increased when the distance from the driven end is greater. As a result, a narrow erase distribution can be achieved. |
申请公布号 |
US2014043916(A1) |
申请公布日期 |
2014.02.13 |
申请号 |
US201313960360 |
申请日期 |
2013.08.06 |
申请人 |
SANDISK TECHNOLOGIES INC. |
发明人 |
COSTA XIYING;YU SEUNG;SCHEUERLEIN ROY E.;LI HAIBO;MUI MAN L. |
分类号 |
G11C16/14;G11C16/24 |
主分类号 |
G11C16/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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