发明名称 METHOD OF CALIBRATING MARKING IN LASER MARKING SYSTEM
摘要 In a method for calibrating marking in a laser marking system, (a) each chip is assigned to be observed to a corresponding vision camera, (b) a coordinate of the vision camera and a coordinate of the laser marker are matched, (c) a predetermined first symbol is marked on a chip or at a position corresponding to the chip, a selected first symbol is observed using the corresponding vision camera, and one point of the first symbol is taught as a reference point, (d) the first symbol and the reference point of the chip are observed using the corresponding vision camera and a second symbol is marked on the chip with respect to the reference point, (e) the second symbol on a selected chip is observed and one point of the second symbol is taught as a comparison point, and (f) a position of the comparison point is detected from the reference point on the chip and the marking error in each cell is calculated.
申请公布号 AU2003222499(A1) 申请公布日期 2003.11.10
申请号 AU20030222499 申请日期 2003.04.25
申请人 EO TECHNICS CO., LTD. 发明人 YOUNG-SIK BYUN;GOO-CHEOL KWON;TAE-JUNG KIM;BYOUNG-HWAN KIM;JEONG-KU LEE
分类号 B23K26/00;H01L21/00;H01L21/68;H01L23/544;(IPC1-7):H01L23/544 主分类号 B23K26/00
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