INTEGRATED CIRCUIT TEST SYSTEM WITH LOG FUNCTION, LOG INFORMATION ANALYSIS METHOD AND LOG INFORMATION ANALYSIS PROGRAM

摘要

PROBLEM TO BE SOLVED: To efficiently debug a program by adding the function (log function) of outputting the execution step of the program and a test parameter to a display device or a file in real time. SOLUTION: An integrated circuit test system debugs an integrated circuit measurement program by a control computer 1 controlling integrated circuit test device hardware 2 and gathers the log information of the integrated circuit measurement program. The control computer comprises: an execution control part 1-1 for controlling the execution of the program; a log function setting part 1-2 for setting log acquisition conditions and log contents; and a log gathering/outputting part 1-3 for gathering and outputting log information corresponding to the setting of the log function setting part. COPYRIGHT: (C)2004,JPO