发明名称 Method of cleaning a dual damascene structure
摘要 A method of cleaning a dual damascene structure. A first metal layer, a cap layer, and a dielectric layer are formed on a substrate in sequence. Then a dual damascene opening is formed in the dielectric layer and the cap layer, exposing the first metal layer. Then, a post-etching cleaning step is carried out to clean the dual damascene opening, and there are two types of cleaning methods. The first method uses a fluorine-based solvent to clean the dual damascene opening. An alternative cleaning method uses a hydrogen peroxide based solvent at a high temperature, followed by a hydrofluoric acid solvent cleaning step. Then, an argon gas plasma is sputtered to clean the dual damascene opening before a second metal layer fills in the dual damascene opening.
申请公布号 US2003205249(A1) 申请公布日期 2003.11.06
申请号 US20030407626 申请日期 2003.04.04
申请人 UNITED MICROELECTRONICS CORP. 发明人 WU CHIH-NING;CHIEN SUN-CHIEH
分类号 H01L21/311;H01L21/768;(IPC1-7):B08B3/00 主分类号 H01L21/311
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