发明名称 MEMBER FOR SEMICONDUCTOR MANUFACTURING SYSTEM AND ITS MANUFACTURING METHOD
摘要 A technique of forming a composite oxide coating film excellent in metal-contamination resistance and corrosion resistance to, e.g., hydrofluoric acid and hydrochloric acid on the surface of a member for a semiconductor manufacturing system. A slurry of silicon oxide-aluminum oxide-chromium oxide and a sintering aid for producing an amorphous inorganic substance by sintering is applied to the surface of the base, and the base is heated and baked at 250-750°C to form a composite oxide coating film and to form a deposite layer of amorphous inorganice particles by using a chromium oxide aqueous solution containing a sintering assistant
申请公布号 WO03092064(A1) 申请公布日期 2003.11.06
申请号 WO2002JP11086 申请日期 2002.10.25
申请人 TOKYO ELECTRON LIMITED;TOCALO CO., LTD. 发明人 SAITO, YUKIMASA;SAKURAI, HIROSHI;HASEBE, KAZUHIDE;OKADA, MITSUHIRO;ENDO, ATSUSHI;ONODERA, NORIYUKI;OGAWA, JUN;TANI, KAZUMI;MIYAJIMA, KIYOSHI;TERATANI, TAKEMA;HAMAGUCHI, TATSUYA
分类号 C04B35/18;H01L21/316;(IPC1-7):H01L21/31;H01L21/02;C23C22/24 主分类号 C04B35/18
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