| 摘要 |
PURPOSE: A semiconductor test apparatus is provided to be capable of reducing the area of a probing pad by using a multi probing pad. CONSTITUTION: A multi probing pad comprises a common probe pad for testing wafer level, a probe signal control part(30) for selecting a specific block, a probe signal generating part(50), and a multiplexing part(20). The probe signal generating part(50) applies a test signal into the specific block via the common probe pad. The multiplexing part(20) outputs selectively a normal signal corresponding to a test enable signal and the test signal from the probe signal generating part(50).
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