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发明名称
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND TEST METHOD THEREOF
摘要
申请公布号
KR20030085466(A)
申请公布日期
2003.11.05
申请号
KR20030001948
申请日期
2003.01.13
申请人
发明人
分类号
G01R31/28;G11C29/00;G01R31/3183;G11C29/12;G11C29/44;H01L21/82;H01L21/822;H01L27/04;H02H3/05
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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