发明名称 |
Apertureless near-field scanning raman microscopy using reflection scattering geometry |
摘要 |
An apertureless near-field scanning Raman microscope using reflection geometry. A laser beam focused to a small spot size on a sample onto which a silver coated metal probe is positioned. With this arrangement, it is possible to obtain enhanced near-field spectroscopy using reflection geometry. Near-field spectroscopic mapping can be done in a short time without extensive sample preparation.
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申请公布号 |
US6643012(B2) |
申请公布日期 |
2003.11.04 |
申请号 |
US20020078711 |
申请日期 |
2002.02.21 |
申请人 |
NATIONAL UNIVERSITY OF SINGAPORE |
发明人 |
SHEN ZE XIANG;SUN WANXIN |
分类号 |
G01J3/44;G01N21/65;G01Q60/18;(IPC1-7):G01J3/44 |
主分类号 |
G01J3/44 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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