| 摘要 |
PURPOSE: A CMOS image sensor with test pattern for evaluating characteristics is provided to be capable of evaluating matching property of a transistor in a pixel array. CONSTITUTION: A CMOS image sensor having a test pattern includes a transistor array composed of a transistor used in a pixel array and a pad array. The pad array is capable of addressing each transistor in the transistor array. The transistor used in the pixel array is a transfer transistor, a reset transistor, a drive transistor, a select transistor, or a load transistor.
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