发明名称 MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To eliminate accidental etching on a wafer surface by preventing a liquid chemical used for back etching from sneaking to the wafer surface when the rear surface of the wafer is back-etched. SOLUTION: After a resist pattern is formed at the outermost peripheral part of the wafer surface, the rear surface of the wafer is back-etched using the liquid chemical to reduce the thickness of the wafer. The back etching is performed after allowing a passivation film to remain only at a scribe line that separates a semiconductor chip present at the outermost peripheral part of the wafer surface. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003309103(A) 申请公布日期 2003.10.31
申请号 JP20020116396 申请日期 2002.04.18
申请人 OKI ELECTRIC IND CO LTD 发明人 UCHIYAMA AKIRA;KAMATA HIROSHI
分类号 H01L21/306;H01L21/314;H01L21/78;(IPC1-7):H01L21/306 主分类号 H01L21/306
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