发明名称 |
MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To eliminate accidental etching on a wafer surface by preventing a liquid chemical used for back etching from sneaking to the wafer surface when the rear surface of the wafer is back-etched. SOLUTION: After a resist pattern is formed at the outermost peripheral part of the wafer surface, the rear surface of the wafer is back-etched using the liquid chemical to reduce the thickness of the wafer. The back etching is performed after allowing a passivation film to remain only at a scribe line that separates a semiconductor chip present at the outermost peripheral part of the wafer surface. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2003309103(A) |
申请公布日期 |
2003.10.31 |
申请号 |
JP20020116396 |
申请日期 |
2002.04.18 |
申请人 |
OKI ELECTRIC IND CO LTD |
发明人 |
UCHIYAMA AKIRA;KAMATA HIROSHI |
分类号 |
H01L21/306;H01L21/314;H01L21/78;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/306 |
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