发明名称 Process for electrically insulating structured metal layers on a semiconductor substrate comprises applying a high density plasma oxide layer to fill a structured metal layer, planarizing the oxide layer, and applying a covering oxide layer
摘要 Process for electrically insulating structured metal layers on a semiconductor substrate comprises applying a high density plasma oxide layer (3) to fill a structured metal layer (2) up to its surface, planarizing the oxide layer using chemical-mechanical polishing selectively on the structured metal layers, and applying a covering oxide layer (5) to cover both the metal layers and the oxide layer.
申请公布号 DE10237852(A1) 申请公布日期 2003.10.30
申请号 DE20021037852 申请日期 2002.08.19
申请人 INFINEON TECHNOLOGIES AG 发明人 BOSK, PETER
分类号 H01L21/3105;H01L21/316;H01L21/768;(IPC1-7):H01L21/768;H01L21/310 主分类号 H01L21/3105
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