发明名称 |
Method of fabricating a semiconductor device of high-voltage CMOS structure |
摘要 |
A transistor of a second conductivity type is of an LMOS structure, and a transistor of a first conductivity type is of an LDMOS structure. The transistor of the first conductivity type has a drain base layer which functions in the same manner as a drain offset diffusion layer and is formed in a substrate separately from a source base diffusion layer. The transistor of the first conductivity type has a stably high breakdown voltage and a low on-state resistance as with the transistor of the second conductivity type.
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申请公布号 |
US6638798(B2) |
申请公布日期 |
2003.10.28 |
申请号 |
US20010964393 |
申请日期 |
2001.09.28 |
申请人 |
NEC ELECTRONICS CORPORATION |
发明人 |
KOBAYASHI KENYA |
分类号 |
H01L29/786;H01L21/336;H01L21/77;H01L21/8238;H01L21/84;H01L27/092;H01L27/12;(IPC1-7):H01L21/00 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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